Go beyond the Next:
We blaze new trails for
semiconductor innovation
About
Go beyond the Next:
We blaze new trails for semiconductor innovation
We contribute to innovative creation with combined support for materials, equipment and analysis

Since its founding, Toray has continued to create innovative materials and contribute to society.

In our semiconductor business, we strive to provide technologies that consistently go beyond the Next, while also following the big picture of industry trends.
We will continue to propose the best solutions for our customers' business innovations from the perspectives of materials, equipment and analysis.
By going beyond the Next, we are here to blaze new trails for semiconductor innovation and support your business.

Materials
We propose high-performance materials with added value that suit customer needs.
We are constantly working to develop new materials and have a complete system for providing the best materials.
Equipment
We provide all-around packaging, inspection and measurement equipment that offers precision, speed and performance. To contribute to customers' R&D and mass production needs, we are striving to develop equipment for the next generation.
Analysis
We provide analysis results using the optimum analytical technologies for customer needs.
Based on this data, we discuss and work together with customers to develop useful solutions for their problems.

Solution

We bring innovation to the constantly changing environment by integrating materials, equipment and analysis

Discover our proven record of providing optimal solutions through innovative materials, equipment and advanced analysis.

Development of Micro-LED Display Technologies
Materials
Equipment
Analysis

We provide material, equipment and analysis support for laser transfer technology, which is critical to the display production processes. We have unraveled the micro-LED transfer mechanism, contributing to breakthroughs in manufacturing processes.

Power Device Defect Analysis
Equipment
Analysis

Defect modes detected by the INSPECTRA™ optical inspection systems are given cross-section structural analysis using scanning electron microscope analysis. We support high-precision needs in semiconductor manufacturing processes through verification of detected defects of interest and defect detection results and cross-section structural simulation using the INSPECTRA™ systems.

Products

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